Introduction To Thermal Shock Testing. Thermal Shock is performed to determine the ability of a part electronics devices, electronic products, etc to withstand sudden changes in temperature. It is the most severe type of test of all the temperature related tests as it involves a high rate of change of temperature. The part is usually placed in a chamber of which it is exposed to very low temperature and move to a very high temperature within a short period before going back to room temperature. This is repeated over a few cycles. There are 2 types of system testing used i.
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Thermal Fracture and T Thermal shock. Thermal Shock Test by MCR20, ver. Study of Thermal Stres Power Integrity Chip-P JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally.
JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, or processes. The information included in JEDEC standards and publications represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint. No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met.
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NOTE The maximum load is the maximum mass of specimens and fixtures that can be placed in the working zone of the bath while maintaining specified temperature and times. NOTE The worst-case indicator specimen location is identified during the periodic characterization of the worst-case load temperature.
The thermal capacity and liquid circulation must enable the working zone and loads to meet the specified conditions and timing see 4. Worst-case load temperature shall be continually monitored during test by indicators or recorders reading the monitoring sensor s. The worst-case load temperature under maximum load conditions and configuration shall be verified as needed to validate bath performance.
The load shall then be subjected to the specified condition in Table 1 for a specified number of cycles. Completion of the total number of cycles specified for the test may be interrupted for the purpose of loading or unloading of device lots or as the result of power or equipment failure.
However, if the number of interruptions for any given test exceeds 10 percent of the total number of cycles specified, the test must be restarted from the beginning. The load may be transferred when the worst-case load temperature is within the limits specified in Table 1. However, the minimum dwell time shall not be less than the total time required for the load to achieve the required temperature and the load shall reach the specified temperature within the dwell time.
Table 2 — Physical property description of perfluorocarbon fluids. If the change to a concept involves any words added or deleted excluding deletion of accidentally repeated words , it is included. Some punctuation changes are not included. Page 1 1 1 1 1 2 2 2 2 2 2 3 Description of Change Renumbered subclause 1. Arranged terms and definitions in clause 2 in Alphabetical order.
Subclause 3. Subclause 4. Clause 2 renumbered to clause 3 Clause 3 renumbered to clasue 4 nd Claue 4, Procedure — 2 sentence; reworded to be consistent with Table 1. All comments will be collected and dispersed to the appropriate committee s. Suite Arlington, VA Fax: Recommendations for correction: 3.
Thermal Shock Testing For Reliability of Electronic Devices