You are currently using the site but have requested a page in the site. Would you like to change to the site? Miron Abramovici , Melvin A. Breuer , Arthur D.
|Published (Last):||23 August 2018|
|PDF File Size:||7.98 Mb|
|ePub File Size:||7.98 Mb|
|Price:||Free* [*Free Regsitration Required]|
You are currently using the site but have requested a page in the site. Would you like to change to the site? Miron Abramovici , Melvin A. Breuer , Arthur D. Melvin A. Arthur D. All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.
Undetected location. NO YES. Digital Systems Testing and Testable Design. Selected type: Hardcover. Added to Your Shopping Cart. Out of stock. This is a dummy description. This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field.
Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
Table of contents Preface. How This Book Was Written. Logic Simulation. Fault Modeling. Fault Simulation. Testing For Single Stuck Faults. Testing For Bridging Faults. Functional Testing. Design For Testability. Compression Techniques. Built-In Self-Test.
Logic-Level Diagnosis. Self-Checking Design. PLA Testing. System-Level Diagnosis.
Published by Jaico Publishing House Seller Rating:. About this Item: Jaico Publishing House, Condition: Good. Ships from Reno, NV.
Digital systems testing and testable design
Digital Systems Testing and Testable Design